[BAU10] A. Baumgartner, C. Hranitzky, H. Stadtmann, and F.J. Maringer
Determination of Photon Fluence Spectra form a Co-60 Therapy Unit based on PENELOPE and MCNP Simulations
Radiat. Meas., in press, 2010

[BOC05] J. Boch, F. Saigné, R.D. Schrimpf, J.-R. Vaillé, L. Dusseau, S. Ducret, M. Bernard, E. Lorfevre, and C. Chatry
Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiements
IEEE-TNS, vol. 52 (6), p. 2616, December 2005

[BOC06] J. Boch, F. Saigné, J-F. Carlotti, A.D. Touboul, S. Ducret, M.F. Bernard, R.D. Schrimpf, F. Wrobel, and G. Sarrabayrouse
Dose Rate Effects in Bipolar Oxides: Competition between Trap Filling and Recombination
Appl. Phys. Letters, vol. 88, p. 232113, 2006

[ENL91] E. Enlow, R. Pease, W. Combe, R.D. Schrimpf, and N. Nowlin
Response of Advanced Bipolar Process To Ionizing Radiation
IEEE-TNS, vol. 38 (6), p. 1342, December 1991

[FRE98] R.K. Freitag and D.B. Brown
Study of Low-Dose-Rate Radiation Effects on Commercial Linear Bipolar ICs
IEEE-TNS, vol 45 (6), p. 2649, December 1998

[JOH94] A.H. Johnston, G.M. Swift, and B.G. Rax
Total Dose Effects in Conventional Bipolar Transistors and Linear Integrated Circuits
IEEE-TNS, vol. 41 (6), p. 2427, December 1994

[RAS02] S.N. Rashkeev, C.R. Cirba, D.M. Fleetwood, R.D. Schrimpf, S.C. Witczak, A. Michez, and S.T. Pantelides
Physical Model for Enhanced Interface-Trap Formation at Low Dose Rates
IEEE-TNS, vol. 49(6), p. 2650, 2002