Traditionally, Total Ionising Dose (TID) characterisation of bipolar based EEE components is performed at high dose rates reducing test time at irradiation facilities and hence costs. The dose rates employed are usually significantly higher than those experienced by components in-flight. Over the last decade Enhanced Low Dose Rate Sensitivity (ELDRS) has been observed and reported in the literature and considered to be of serious concern, demonstrating the need for radiation testing performed at low dose rate. The ELDRS effect is manifested as increased component degradation with decreasing TID dose rate. ELDRS affects bipolar technologies.

Today, ELDRS testing of components is comprised at low dose rates, representing a significant cost item and complicating project schedule depending on project TID requirements. This is in particular true for high TID level projects such as telecommunication and navigation. To address some of these issues a number of accelerated ELDRS test methods have been proposed. One of them, the so-called accelerated switching test method, is investigated within the scope of this project. This test method has been shown to reduce low dose rate testing time significantly for selected part types and electric parameters. Its general applicability on a comprehensive set of electric parameters will be investigated using a large set of different part types.